"Probing the Absolute Scattering Intensity by means of a Lab-based SAXS Camera Using an Imaging Plate Detector."
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Autor:
Gutsche, A., Dingenouts, N., Guo, X., Meier, M., Nirschl, H.
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Quelle:
J. Appl. Crystallogr. 2015 (Accepted for publication).